Dual-Sided Flying Probe Tester – Takaya APT-2600FD

The Takaya APT-2600FD is a dual-sided flying probe tester designed to deliver wide test coverage while maintaining efficient cycle times. It performs simultaneous probing on both sides of the PCB, with up to six probes on the component side and four on the solder side. This approach increases fault detection while reducing handling and overall testing costs. The system features IC-OPEN technology for advanced detection of IC and BGA solder defects, along with Zero-Impact Probe Control to minimise mechanical stress on the board. Its 3D inspection module and high-resolution vision support accurate reading of complex markings and detailed evaluation of component shapes or PCB deformation. Additional tools include an integrated temperature sensor for identifying semiconductor failures, an LED colour sensor for stable inspection of light variations, and an automatic probe-cleaning mechanism to maintain measurement reliability. Fully compatible with Industry 4.0 environments, the APT-2600FD ensures smooth network integration and fast defect tracking across production lines. With a modular architecture that adapts to specific user requirements, the system is suitable for both production environments and prototyping stages, offering flexibility and dependable test performance.