Simple measurement of the shape of even complex reflective surfaces (freeforms) with nanometric precision thanks to coaxial deflectometry

Simple measurement of the shape of even complex reflective surfaces (freeforms) with nanometric precision thanks to coaxial deflectometry

Thursday, March 13, 2025 3:30 PM to 3:45 PM · 15 min. (Europe/Paris)
Zone de pitch métrologie
Pitch

Information

Environment / Vision

Log in